1. Photochemical Production and Identification of cis-cis 1,3,5,7-Octatetraene (1982) J. Phys. Chem., 86, with B.E. Kohler and M. Hossain.

  2. Emission and 1- and 2-photon Excitation Spectra for the 1Ag- 2Ag Origin Region of cis-cis 1,3,5,7-Octatetraene, J. Chem. Phys., 79(2), 583 (1983) with B.E. Kohler.

  3. Chemical Applications of Scanning Tunneling Microscopy, IBM J. Res. Dev., 30, 484, September 1986, with J. Kramer, D.V. Baxter, R.J. Cave, and J.D. Baldeschwieler.

  4. Barriers in the Excited 2Ag State of cis, trans Isomerizatoin of cis, cis- octatetraene: General Features of the Excited State Potential, J. Chem. Phys. 85(5), 4436 (1986) with B.E. Kohler and P. Mitra.

  5. An XPS Investigation of the Incorporation of Surface Oxides Into Bulk Zirconium, J. Vac. Sci. Tech. A, Vol 5, No. 4, pt. 2, July-Aug. pp 1124-7 (1987) with P.M. George.

  6. Evidence for Schottkey Emission in Scanning Tunneling Microscopes Operated in Ambient Air, Appl. Phys. Lett. 52, 2086 (1988) with J. Jahanmir, and T.H. Rhodin.

  7. Surface Modifications of a-Si:H with a Scanning Tunneling Microscope. J. Appl. Phys. 65, 2064 (1989) with J. Jahanmir, S. Hsieh, and T.H. Rhodin.

  8. Applications of STM Technologies, SPIE Vol. 1087 Integrated Circuit Metrology, Inspection, and Process Control III (1989) 407, with S. Henely.

  9. Current-Voltage Characteristecs of Silicon Measured with the Scanning Tunneling Microscope in Air, J. Vac. Sci. Tech. A, 7, 2741 (1989) with J. Jahanmir, A. Young, and T.N. Rhodin.

  10. Local Modifications of Thin SiO2 Films in a Scanning Tunneling Microscope, J. Appl. Phys. 67(11) (1990) with J. Jahanmir and P.C. Colter.

  11. Comparison of Scanning Force Microscope and Scanning Electron Microscope Analysis of Poly-Silicon with G.D. Aden, R.T. Jobe and B. Roth, Scanning, 1991

  12. Thermal Conductivity Contrast Imaging with A Scanning Thermal Microscope, Thermal Conductivity, 22, T.W. Wong (ed.), Technomics (1994) with R.B. Dinwiddie and R.J. Pylki.

  13. Scanning Near-Field Optical Microscopy and Scanning Thermal Miroscopy, Jpn. J. Appl. Phys. Vol 33 3785 (1994) with R. Pylkki, P. Moyer.

  14. In Situ AFM Study of the Surface Morphology of Polypyrolle Film, Synthetic Metals 74 127-131 (1995). With J. Li, E. Wang, M. Green

  15. Optimizing AC-Mode Atomic Force Microscopy, Scanning, Vol. 18, No 5 339-343 (1996) With H. Ho.

  16. Development of a Scanning Tunneling Microscopy-based electron beam induced current (EBIC) microscope. Scanning Microscopy, vol. 10. no. 1, 33-38, with P. Koschinski, V. Dworak, and LJ Balk.

  17. Atomic Steps With Tuning Fork Based non-Contact Atomic Force Microscopy, Submitted to J. Appl. Phys., Vol. 75, no. 11, 13 (Sept 1999), With W.H.J. Rensen, A.G.T. Ruiter, N.F. van Hulst.

  18. Silicon Single Atom Steps as AFM Height Standards, SPIE-Int. Soc. Opt. Eng. Proceedings of SPIE, Vol. 4344 157-158 (2001) with R. Dixon, N. Orji, J. Fu, V. Tsai, E. Williams, T. Vorburger, H. Edwards, D. Cook, R. Nyffenegger.

  19. Crystal Sensor for Microscopy Applications, Applied Physics Letters, Volume 86, Issue 1, (2005), with Z. Peng.

  20. Dilation and AFM Capabilities in the Characterization of Nanoparticles,  Ch. Wong, P.West, K. Olson, M.L. Mecartney, N. Starostina, Tip  Journal of  Materials, 7. pp.12-16, (January 2007)

  21. Tip Dilation and AFM Capabilities in the Nanoparticle Characterization, Journal of Materials, Vol 59, No 1 12-16 (2007) with Ch. Wong, K.S. Olson, M.L. Mecartney, and N. Starostina

  22. A Comparison of Atomic Force Microscopy (AFM) and Dynamic Light Scattering (DLS) Methods to Characterize Nanoparticle Size Distribution, J. Nanopart. Res. 10:89-96 (2008) with C.M. Hoo, N. Starostina, and M. Mecartney

Instructional Publications

  1. The Scanning Probe Microscope: A Powerful Tool for Visualizing the Micro World, American Laboratory, Feb. 1991, With J.Gill, and J. Baldeschwieler.

  2. The Atomic Force Microscope: Extending Microscopy to the Subnanometer Range, International Laboratory,  March 1992

  3. The Atomic Force Microscope: A New Era in Microscopy, EM Views, Issue 7, 1993

  4. Atomic Force Microscope Combined With a Scanning Electron Microscope, Japanese Electron Microscopy Society, 1994

  5. Growing Large by Seeing Small Things, Chemtech, Vol 24, No 1, 1994

  6. Inspecting Surfaces With a Sharp Stick: Scanning Probe Micrscopy – Past, Present, and Future, Mic. Today, Mar/Apr. 2003 pp 5 - 8

  7. Imaging: From video games to scanning probe microscopy AM LAB 35(16): 24 August 2003, with J Li.

  8. How to Recognize and Avoid AFM Image Artifacts, Mic. Today, Vol 11, No. 3, May/June 2003, pp 20-26 with N. Starotina

  9. Practical Guide to AFM Probe Tips, Micro/Nano, Dec. 2003  with T. Nollin

  10. Atomic Force Microscopy, Adv. Mat. & Proc., Feb. 2004, pp 35 – 37, with N. Staraostina.

  11. SPM for Everyone, Mat. Today, Mar 2004

  12. Choose the Right Combo of Sensors & Scanning Modes, Micro/Nano, Jan 2004 with T. Nolli
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